This invention discloses a glass substrate inspection system applied to quality inspection in display panels, semiconductors, and precision optoelectronics industries. The system integrates high-resolution image acquisition modules, precision positioning mechanisms, and intelligent image analysis algorithms to detect surface defects, scratches, cracks, and dimensional anomalies in real time. Automated inspection significantly improves accuracy and production efficiency while reducing human error, making it suitable for high-throughput manufacturing environments.
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