【Patent Number】：ZL 2021 2 0976793.6
【Patent Name】：Clamshell-type Two-stage Down-pressing
Probe Testing Mechanism
【Summary】：
The utility model discloses a flip-cover type two-stage
downward pressing needle testing mechanism, comprising: a probe and a needle
pricking mechanism connected with the probe, the needle pricking mechanism and
the probe are arranged on a carrier plate, and the needle pricking mechanism
comprises: An upper cover, a base and a buckle, the upper cover and the base
are rotatably connected, and the upper cover and the base can be tightly fitted,
the base is movably connected with the carrier tray, and the base Linear
sliding relative to the width of the carrier plate, the clip is located near
the base, the clip is movably connected with the carrier plate, and the active
route of the clip faces the base; the probe is installed On the upper cover,
the probe is located on the side where the upper cover and the base can be
turned over to fit, and the probe is oriented parallel to the moving route of
the base relative to the carrier plate. The utility model The middle probe is
no longer damaged due to lateral force, reducing the cost of probe loss and the
labor cost of replacing the probe.
